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Rentgenovskaya difraktometriya. In Russian /X-ray diffractometry - Hayker, Daniel Moiseevich


Condizioni del lotto: Buono (pochissimi segni di utilizzo)
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Autor: Hayker, Daniel Moiseevich

Lugar: Moscow

Año: 1963

Idioma: Russian


Short description: In Russian. Hayker, Daniel Moiseevich. X-ray diffractometry. Moscow: Physmatgiz, 1963. The image is provided for reference only. It may reflect condition of one of the available copies or only help in identifying the edition. Please feel free to contact us for a detailed description of the copies available. SKU6383409
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Da 11/12/2023
Stati Uniti (PLAINVIEW)
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